IC Lead Visual Inspection System

Real-time Analysis of an IC Wire-bonding Inspection System

T hough the need to consider all aspects of real-time in the development of a system is not new to control engineers, they are relatively new to the machine vision specialists, especially as they tend to come from various di€erent backgrounds. In practice most vision experts tend to ``tweak'' their systems to match the speed of the application environment. They rarely use any formal or indeed i...

IC Printed Mark Quality Inspection Algorithms

Deposition uniformity inspection in IC wafer surface

This paper focuses on the task of automatic visual inspection of color uniformity on the surface of integrated circuits (IC) wafers arising from the layering process. The oxide thickness uniformity within a given wafer with a desired target thickness is of great importance for modern semiconductor circuits with small oxide thickness. The non-uniform chemical vapor deposition (CVD) on a wafer su...

User Programmable Visual Inspection

The usefulness of advanced machine vision techniques for automated inspection is restricted by long development cycles for the inspection software and a lack of general applicability of the resulting system. These difficulties arise because in the majority of cases the particulars of the inspection are embedded in the software structure resulting in severe restrictions on user reconfiguration. ...

Mining Linguistic Information for Configuring a Visual Surface Inspection System

The configuration of a surface inspection vision system as a complex task, requires mining associations among attributes due to the variability of the surface and the environment in real-time production process. The surface inspection task has to change to deal with different elements such as, wood, stainless steel or paper inspection and, in the case of stainless steel, with reflectance and th...